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Document Brief

HITACHI SPECTROPHOTOMETER...

Measurement Systems for Optical Parts / New Materials...

System Configuration Catalog...

Micro Sample Reflectance Measurement System Wafer Reflectance/Transmittance Measurement System Optical Thin Film Reflection Measurement System Lens Transmittance Measurement System Other Accessories Examples of Custom-designed System and Optional Software...

Solid Sample Measurement System...

This system is optimum for transmittance/reflectance measurement of solid samples. It is possible to construct an optimum system according to the purpose of measurement in combination with optional accessories....

Monochromator Prism-grating / Sample compartment Standard System compartment / Detector Standard integrating sphere / Configuration sample Measuring wavelength range 240 to 2,600nm / Sample size 200 ...

77mm 486mm...

Reference beam...

Optical path...

214mm 54mm...

Customization according to Target Sample or Application Purpose Allows User to Construct an Optimum System....

The Model U-4100 Spectrophotometer allows the user to combine a monochromator, detector and sample compartment according to the target sample and application purpose. It is possible to construct a system which satisfies various analytical needs (ultraviolet region measurement system which permits measurement down to 175nm, very large sample compartment for non-destructive measurement of large samples, for example). The Model U-4100 ensures high-sensitivity analysis in a wide variety of fields including semiconductor/new material development and biotechnology....

Sample beam...

Specimen compartment (side view)...

Specimen compartment (top view)...

Large Sample Measurement System...

This system permits non-destructive transmittance/reflectance measurement of various optical and electronic materials including large-sized glass, silicon wafer and liquid crystal board....

Monochromator Prism-grating / Sample compartment Large sample System / Detector Standard integrating sphere / Measuring Configuration compartment wavelength range 240 to 2,600nm / Sample size 430 430mm max....

Micro Sample Reflectance Measurement System...

Small 5 specular reflectance accessory (absolute) for U-4100 P/N 134-0103...

Wafer Reflectance/Transmittance Measurement System...

Top-mount transmittance/reflectance measurement unit (relative) for U-4100 P/N 134-0107...

Optical Thin Film Reflection...

Document Keywords

Model U - 4100 System Configuration Catalog sites default files 4100 accy htb e034

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