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TANDEX TEST LABS, INC....

15849 Business Ctr. Dr. Irwindale CA. 91706 Phone (626)-962-7166 Fax (626)-960-6896...

SCANNING ELECTRON MICROSCOPE ANALYSIS...

TTL # TAN-289-01-W...

Date October 4, 1999 Part Number LM124K Part Type I.C. Lot Date Code 9938 Lot Number 501-42 HMO98736 Manufacturer NSC Quantity Eight (8) Purchase Order 9566...

Prepared by Rose Marie Escandon...

Approved by John R. Espenschied...

TANDEX TEST LABS TTL # TAN-289-01-W Summary...

Eight (8) Integrated Circuits (P/N LM124K) were submitted by Tandex Test Labs, Inc., for SEM Analysis per Mil-38534 Class K requirements. This Analysis was performed in accordance with Mil-Std-883,Method 2018. The devices were assigned sample number 1 through 8 by Tandex Test Labs....

Plasma Etching Carbon Tetraflouride Gas 92% and 8% Oxygen was used to remove the glassivation. This etching is destructive and uneven in the rates of glass removal in various areas of the die. Scanning Electron Microscope (SEM Inspection) was performed on all of the devices.The devices have adequate metallization coverage.These devices meet the requirements of Mil-Std-883, Method 2018. See figures 1 through 3, for typical photographs. Conclusion The devices were inspected to the requirements of Mil-Std-883, Method 2018. No rejectable anomalies were noted which would affect device reliability, this lot is acceptable for use....

TANDEX TEST LABS TTL # TAN-289-01-W SEM EXAMINATION...

TTL Job No. TAN-289-01-W Lot Date Code 9938 Misc. ID Lot #501-42 HMO98736...

Part Number LM124K Sample Qty. 8 Qty . Accept 8...

Part Type Integrated Circuits Serial Numbers 1-8 Qty. Reject 0...

Date October 4, 1999 Test Specifications Mil-Std-883 Method 2018 Qty. Suspect 0...

S/N 1 2 3 4 5 6 7...

Investigation Findings / Comments No Anomalies No Anomalies No Anomalies No Anomalies No Anomalies No Anomalies No Anomalies...

No Anomalies...

A/R/S A A A A A A A...

Each sample was inspected for the general metallization condition at a magnification between 1,000 X and 6,000 X over 25% of the total metallization (unless specified differently). Each sample was inspected from four (4) viewing directions at a magnification between 5,000 X and 20,000 X for metallization oxide step coverage (performed on at least one of each type of oxide step). Devices constructed with expanded Metallization Yes X No Inspection required Yes X No No X...

Sample Glassivated Yes X No Dual Level Metallizatio...

Document Keywords

Scanning Electron Microscope sem sample report

About Tandex Test Labs, Inc.

Testing services, Biomedical testing, component processing and packaging, tape and reel services

Contact

626-962-7166, 800-729-8378 (toll free)
Fax: 626-960-6896

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